SESSION F2:  Residual Stresses II

2:10 PM
*Information Volume Of Diffraction Strain Measurements In Single Crystals
I. C. Noyan, Özgür Kalenci, Columbia University, USA

2:30 PM
Limitation Of Distortion In Friction Stir Welded (FSW) Panels Using Needle Peening
S. Larose, L. Dubourg, M. Jahazi, C. Perron, NRC Institute for Aerospace Research, Canada

2:50 PM
*Single Grain Diffraction At The APS 1-ID Beamline
U. Lienert, Argonne National Laboratory, USA

3:10 PM
Mechanisms Of Internal Stress Formation In Oxide Scales
H. Pinto, C. Juricic, P. Brito, M. Klaus, Ch. Genzel, A. Pyzalla, Max-Planck Institut für Eisenforschung GmbH, Germany

3:30 PM
*The New GKSS Materials Science Beamlines At DESY: Recent Results And Future Options
A. Schreyer, N. Schell, A. Haibel, F. Beckmann, Th. Lippmann, L. Lottermoser, J. Herzen, T. Fischer, P. Staron, J. Dos Santos, N. Huber, GKSS Research Centre, Germany

3:50 PM - 4:10 PM      Coffee Break

4:10 PM
*A Step Towards A Complete Uncertainty Analysis Of Residual Stress Determination Using Neutron Diffraction
R. C. Wimpory, C. Ohms, Helmholtz-Zentrum Berlin für Materialien und Energie, Germany

4:30 PM
*Residual Stress Analysis In Thin Films By In-Situ Diffraction Measurements During Four-Point Bending
P. Scardi, M. Ortolani, University of Trento, Italy

4:50 PM
*The Effect Of Grain Size On Strain Determination Using A Neutron Diffractometer
M. Hofmann, R. C. Wimpory, U. Wasmuth, J. Rebelo-Kornmeier, Helmholtz-Zentrum Berlin für Materialien und Energie, Germany

5:10 PM
X-Ray Investigation On Strength Of Thin Films
T. Hanabusa, M. Shinohara, The University of Tokushima, Japan

5:30 PM
Residual Stress Measurement By Neutron Diffraction In A Single Bead On Plate Weld – Influence Of Instrument And Measurement Settings On The Scatter Of The Results
Carsten Ohms, Robert Wimpory, Dimitar Neov, European Commission, Netherlands

5:50 PM
*Measurements And Prediction Of Residual Stress Profiles In Indented Disks
Donald W. Brown, Bjurn Clausen, Michael B. Prime, Saurabh Kabra, Pierluigi Pagliaro, Peter Backlund, Sanjiv Shaw, Everett Criss, Los Alamos National Laboratory, USA

*Indicates Invited Paper

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Last updated:
August 14, 2009